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SEE/MAPLD 2018 Tutorials and Invited Talks


SEE Testing Tutorial: Planning and Execution Basics
Ken LaBel & Jonny Pellish, NASA Goddard Space Flight Center

FPGA Basics and FPGA SEE Testing
Nadia Rezzak, Microsemi

SEE Session Invited Talks

The NSRL Facility
Mike Sivertz, NSRL

AE-9/AP-9 Environment Model Update
Tim Guild, The Aerospace Corporation

Model-Based Mission Assurance
Brian Sierawski, Vanderbilt University

Combined SEE/MAPLD Session Invited Talks

New Developments in Error Detection and Correction Strategies for Critical Applications
Melanie Berg, AS&D, Inc. / GSFC

An Informal Introduction to Autonomous Driving
Dr. Xiaodi Hou, Tu Simple

MAPLD Session Invited Talks

SER Qualification and Radiation Effects Implications for Functional Safety in Automotive Electronics
Jyotika Athavale, Intel Corporation

Radiation Qualification of Mass Produced Electronic Systems at CERN
Slawosz Uznanski, CERN

Information Leakage and Mitigations: from Smartcards to SoCs
Ro Cammarota, Qualcomm

Measuring Trust
Jonathan Graf, Graf Research
Contact Us
General Chair: SEE: Jeff George, The Aerospace Corporation / MAPLD: Melanie Berg, AS&D, Inc./NASA Goddard Spaceflight Center
Technical Chair: SEE: Katherine Scott, The Boeing Company / MAPLD: Slawosz Uznanski, CERN
Poster Session Chair: Martha O'Bryan, AS&D, Inc. / NASA Goddard Space Flight Center
Industrial Exhibit Chairwoman: Teresa Farris, Cobham Semiconductor Solutions
Local Arrangements & Registration Services: Susan Hunt, STAMP Services
Website Curator: Carl Szabo, AS&D, Inc. / NASA Goddard Space Flight Center

SEE Symposium and MAPLD are supported by Cobham Semiconductor Solutions, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University.

SEE Symposium and MAPLD are sponsored by SEE Symposium, California