2024 SEE/MAPLD Schedule
SEE/MAPLD Schedule (printable pdf)

Tuesday, May 14, 2024
Time (PST) Session Title Speaker Organization
8:10 AM Intro Workshop Opening Remarks Adrian Ildefonso US Naval Research Laboratory
8:20 AM SEE Technical Program Introduction Krysten Pfau Lockheed Martin
8:30 AM Environments and Facilities Session Intro
8:40 AM Understanding High Energy SEE and Opportunities at Brookhaven National Laboratory Kevin Brown Brookhaven National Laboratory
9:00 AM Status of the K150 Cyclotron Upgrade Project and Radiation Effects User Statistics at Texas A&M University Henry Clark Texas A&M University
9:20 AM Ongoing Developments at the 88-Inch Cyclotron Janilee Benitez LBNL
9:40 AM 88-Inch Cyclotron BASE Facility Microbeam Update 2024 Alex Donoghue LBNL
10:00 AM Break
10:30 AM Environments and Facilities The RADHUB Radiation Hardness Assurance Tool Suite Brian Sierawski Vanderbilt University
10:50 AM Tutorial Development of Space Environmental Effects Digital Laboratory (SEE-D Lab) for the Natural Space Radiation Environment Kerry Lee The Aerospace Corporation
11:20 AM The Proton Radiation Environment in LEO & MEO: an Overview of Variability and Risks Alex Lozinski UCLA
11:50 AM Lunch
1:30 PM Education and Workforce Development Session Intro
1:40 PM LabRaTTS: Laboratory Radiation Test Training Simulator Brian Sierawski Vanderbilt University
2:00 PM NASA Parts Engineering School Seth Gordon JPL
2:20 PM Texas A&M University Cyclotron Institute Single Event Effects (SEE) Bootcamp Evolution Gregory Allen/Megan Casey NASA
2:40 PM Academy for Radiation Effects and Survivability Justin Likar/Ken LaBel APL/NASA
3:00 PM Break
3:30 PM Emerging SEE Test Alternatives Session Intro
3:40 PM Neutron Single Events Effects (nSEE) Testing for Microelectronics Resilience in Strategic Environments Robert Cooper Naval Surface Warfare Center - Crane
4:00 PM Criteria for Predicting Heavy-Ion SEE Response Using Surrogate Testing Approaches Joel Hales US Naval Research Laboratory
4:10 PM Screening SEL susceptibility in COTS devices using pulsed Laser Jeremy Guillermin TRAD
4:30 PM Pulsed Electrons for Alternative Radiation effects Characterization of Electronics (PEARCE): An Update George Tzintzarov The Aerospace Corporation
4:50 PM An Update on Pulsed X-ray SEE Testing Capability Development Daniele Monahan The Aerospace Corporation
5:10 PM CHALICE: Calculator for Highly Accurate Laser-Induced Carrier Excitation Adrian Ildefonso US Naval Research Laboratory
5:30 PM End Tuesday May 14
Wednesday, May 15, 2024
Time (PST) Session Title Speaker Organization
8:00 AM Announcements
8:10 AM SEE Testing and Mitigation Session Intro
8:20 AM Use of Bragg Search Testing at TAMU K500 Cyclotron for Determining Overmold Density for Unknown Materials on Sunnyside-Up Parts Keri Kuhn SEAKR
8:40 AM Comparison of Oscillator Single Event Effects Observed for Heavy Ion and Pulsed Laser Testing George Ott Radiation Test Solutions
9:00 AM Impact of Test Equipment on Single-Event Latchup Susceptibility Ahmad Omair Cyclo Technologies, Inc.
9:20 AM Heavy-Ion SET Response of a Wide-Band Operational Amplifier Fabricated in the SkyWater S90LN 90 nm Process James Carpenter Indiana University
9:40 AM Built-in Self-Test Architecture for Characterization of Single Event Effects in Commercially Available Bulk 90nm Technology Spencer Westfall Indiana University
10:00 AM Break
10:30 AM Invited Talk Invited Talk: The Winding Path from SME to Policy Advisor - REMOTE Jonathan Pellish
11:10 AM FPGA SEE Testing Session Intro
11:20 AM SEE rate observations and rate predictions across several generations of AMD-Xilinx FPGAs Sebastian Sabogal NASA GSFC
11:40 AM Multi-bit Upsets in Space FPGAs David Lee Sandia National Labs
12:00 PM Lunch
1:30 PM FPGA SEE Testing Tales from the Cave: Beam Lessons Learned Gary Swift Swift Engineering & Radiation Services
1:50 PM Testing Versal 1902 ACAP on XRTC Gen-4 SEE Platform Hermann Rufenacht XRTC
2:10 PM Single Event Upset Characterization of the Versal AI Core dual-core ARM Cortex A72 Application Processor Unit and Deep Learning Processing Unit Using Proton Irradiation Nelson Hu MDA Canada
2:30 PM SEE Simulation and Data Analysis Techniques Session Intro
2:40 PM A Review of Single Event Upset Rate Calculation Methods Dave Hansen L3 Harris
3:00 PM Break
3:30 PM SEE Simulation and Data Analysis Techniques VIRAD: A New Method for Combined-Radiation-Environment Integrated Circuit Analysis Conrad Jensen Reliable MicroSystems
3:50 PM Curve Fitting to Non-Saturating SEE Data Bill Rowe Raytheon
4:10 PM Proposal of a Multi-Scale High Accuracy Engineering approach for Single Event Effects Analysis in Modern Technologies Jeremy Guillermin TRAD
4:30 PM Break
5:30 PM Industrial Reception
8:00 PM End Wed May 15
Thursday, May 16, 2024
Time (PST) Session Title Speaker Organization
8:00 AM SEE Simulation and Data Analysis Techniques Session Intro
8:10 AM Hierarchy of Knowledge: SEL Edition Ray Ladbury NGSFC
8:30 AM Systematic Assurance Analysis of Components Radiation Effects on System Performance Qi Zhang Vanderbuilt University
8:50 AM Intro Combined/MAPLD Introduction Technical Program Introduction Tom Leahy SiFive
9:00 AM SEE Case Study Session Intro
9:10 AM Heavy Ion Induced SEU and MBU Sensitivity of 3D NAND Flash Structures Jeremy Guillermin TRAD
9:30 AM Recent Observations during SEE Testing of Various Memory Products Helmut Puchner Infineon
9:50 AM Operating System Dependencies on Radiation Reliability in CPU Memory Seth Roffe NASA GSFC
10:10 AM Break
10:40 AM SEE Case Study Novel Protection of Half-Bridges in Space Environments Alex Billings Apogee Semiconductor
11:00 AM An Overview of SEEs in RFIC/MMIC Jeffrey Teng Georgia Tech
11:20 AM Verifying SEFI Requirements for SOCs and Other Complex Devices Steve Guertin JPL
11:40 AM The Use of Block Rolling Offset during TID Testing for Memory Parts Keri Kuhn SEAKR
12:00 PM Lunch
1:30 PM SEE Case Study SEE and TID Radiation Test Results for Managed Flash Memory Devices Ian Troxel Troxel Aerospace Industries
1:50 AM Update on qualification info on Versal, plans for VE2302 Ken O'Neill AMD
2:10 AM Heavy Ion testing results on multi-GB STT-MRAMs Paul Chopelas Avalanche Technologies
2:30 AM Tutorial Open Standards Tom Leahy SiFive
3:00 PM Break
3:30 PM AI/ML, Novel Applicationss and Case Studies Session Intro
3:40 PM Revolutionizing UAV Control: Integrating NLP with Advanced FPGA and FPAA Technologies for Dynamic Reconfigurability Mohamed El-Hadedy Cal Poly Pomona
4:00 PM Optimal SEU Mitigation for FPGA Based Hardware Acceleration of C/C++ Applications Kamesh Ramani Siemens EDA
4:20 PM Break
5:30 PM Poster Session & Career Networking Happy Hour
"What’s New in the Domestic Proton Access for SEE (>200 MeV prime)" Ken LaBel, SSAI / NASA GSFC
"Radiation Characterization of the COTS MyriadX Edge Vision Processing Unit and Use Case in Space Applications" Lucas Tambara, Gaisler
"Recently updated MIL-PRF-38535 spec embraces plastic packaging for next generation ICs" Kurt Eckles, Texas Instruments
"SEE results of radiation tolerant MOSFETs" Oscar Mansilla, Infineon Technologies
"Radiation Hardness Assurance of the 3D PLUS Monitoring CAMera (MCAM) system in the frame of MSR-ERO mission" Ameur Sellai, 3D PLUS
"Harnessing Machine Learning: Parallel Testing and Real-Time Analysis for Accelerated Radiation Effects Dataset Generation" Trevor Peyton, Indiana University
"(Title TBD)" Matt Von Thun, Frontgrade
8:00 PM End Thursday May 16
Friday, May 17, 2024
Time (PST) Session Title Speaker Organization
8:00 AM Design, V&V, and Technical Management of FPGAs/SoCs and PLDs Session Intro
8:10 AM Versal-based Space Applications (placeholder title) Thomas Bradshaw Sandia National Labs
8:30 AM SDRAM Challenges in Space Robert Hillman Power Device Corporation
8:50 AM MAPLD - Optimize FPGA & SoC Configuration for Speed, Resilience & Adaptability Paul Chopelas Avalanche
9:10 AM FLASH Memory Challenges in Space Robert Hillman Power Device Corporation
9:40 AM Rad-Hard 16Gb COnfiguration Memory BOot Manager Pierre-Eric Berthet presenting for Patrice Benard 3D PLUS
10:00 AM Break
10:30 AM FPGA & SoC Assurance Session Intro
10:40 AM Synplify Debug Solution for Functional Safety and High Reliability in FPGAs De'Andre Doughty Hoskins Synopsys
11:00 AM Advanced Node FPGAs for Edge Processing Jim Tavacoli Lattice Semiconductor
11:20 AM Next Step in Low Power Space Processing David Matthes BAE
11:40 AM Closing Remarks
12:00 PM End Friday May 17