SEE/MAPLD Workshop Banner

Welcome to the 30th Edition of the Single Event Effects (SEE) Symposium
coupled with the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop

The 2021 SEE/MAPLD Workshop will be held as a virtual meeting

Tuesday, August 31 - Thursday, September 2, 2021

Click Here for Registration details

Exhibitor Registration Deadline Extended to Monday, August 2nd!

2021 Invited Speakers Announced!





Visit Our Presentation Archive!
Featuring over 700 talks spanning years 2006-2019
Jump to the Archives




Please join us during the week of August 30th, 2021 for the virtually held

30th Edition of the Single Event Effects (SEE) Symposium and Military and Aerospace
Programmable Logic Devices (MAPLD)
Workshop



We are seeking contributions in the following areas, but all submissions will be reviewed. Four sessions are available: SEE, MAPLD, Combined, and Poster. The Combined Session includes submissions that cross SEE and MAPLD themes. The Poster Session can include SEE, MAPLD, or Combined content. Please refrain from technical content reasonably classified as product marketing.

Acknowledging the events of the past year, our technical chairs especially encourage the submission of content focusing on:
1) Standards & Methods 4) Modeling and Simulation
2) Alternatives to Heavy Ion and Proton Testing 5) Relevant Test Facility Updates
3) Space Environments



Submit Your Abstract Here

Deadline has been extended to April 28, 2021
SEE Symposium MAPLD
New! Artificial Intelligence (AI) / Machine Learning (ML) in FPGAs/SoCs: AI / ML design considerations for reliable terrestrial, avionic, and aerospace applications; using AI for SEE mitigation; SEE evaluation of designs leveraging AI / ML
Phenomena: Upsets, Functional Interrupts, Transients, Latchup, Gate Rupture, Burnout, etc. FPGAs/SoCs, PLDs, and New Devices: New and/or novel FPGA and PLDs; Benchmarking of FPGAs and PLDs; Applications of space-borne processing.
Basic Mechanisms and Modeling: Destructive and Non-Destructive Effects, Nanoscale Phenomena, Charge Transport and Collection, Impact of Circuit and Environmental Parameters, etc. Mitigation of Single event effects in FPGAs/SoCs, PLDs, and commercial electronics: Multi-level approaches for high reliability and fault tolerance (redundancy, TMR, SET filtering, etc…), upset mitigation techniques and automated tools, etc.
SEE Mitigation Methods Including Radiation Hardened by Design (RHBD) and by Process (RHBP): Approaches for gaining SEE hardness in commercial devices, etc. Designing with FPGAs/SoCs, and PLDs: agile methods, ESL/HLS and model-based engineering techniques, embedded processing, and synthesis efficiency improvements.
Environments and Facilities: Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Pulsed Laser Test Facilities. Validation and Verification of FPGAs/SoCs, and PLDs: Verification techniques and languages such as co-simulation, System Verilog and OVM/UVM. Simulation speed-up techniques, emulation, new tools and methods for design validation.
Operational Regimes and Performance Data: Systems and Devices from LEO to Interplanetary, High Altitude Aircraft, and Terrestrial. Availability/Reliability/Susceptibility of programmable devices: Failure mechanisms, reliability testing and characterization, packaging reliability, reliable design practices.
Electronic & Photonic Device Data and Measurement Techniques: Memories, Analog/Digital Circuits, systems-on-chip (SoCs), Field Programmable Gate Arrays (FPGAs), Optocouplers, Photonic Integrated Circuits, Power Converters, Sensors, etc. Novel Applications and Case Studies: Reconfigurable computing, high-performance processing using programmable logic, successful deployment of programmable logic, etc.
Systems and Error Rate Computation: Error Mitigation, Error Detection & Correction, Multi-core Processing, and Fault Tolerant Systems; Analytic, Monte Carlo, Mixed-Level, methods, etc. Technical Management of FPGAs and PLDs: Technical leadership, process management and metrics.
Education: Education Practices, Market Demands for Military and Aerospace Component Engineers, and Engineer Retention.
*All options subject to change any time, per the discretion of the conference committee
Note: Our 2021 SEE/MAPLD Preliminary Program remains subject to change!

Tuesday, August 31
PDT EDT Paris Experience Event
6:30 AM 9:30 AM 3:30 PM Live Exhibitor Breakfast
6:45 AM 9:45 AM 3:45 PM
7:00 AM 10:00 AM 4:00 PM Live Opening Remarks, SEE Intro, and MAPLD Intro
7:15 AM 10:15 AM 4:15 PM Live Batch Release 1 Intro
7:30 AM 10:30 AM 4:30 PM Pre-Recorded, On-Demand Batch release 1:
Heavy Ion and Proton Facilities (6 talks) and On-Orbit Radiation Experiments (2 talks)
7:45 AM 10:45 AM 4:45 PM
8:00 AM 11:00 AM 5:00 PM
8:15 AM 11:15 AM 5:15 PM
8:30 AM 11:30 AM 5:30 PM
8:45 AM 11:45 AM 5:45 PM
9:00 AM 12:00 PM 6:00 PM
9:15 AM 12:15 PM 6:15 PM
9:30 AM 12:30 PM 6:30 PM
9:45 AM 12:45 PM 6:45 PM
10:00 AM 1:00 PM 7:00 PM Pre-Recorded with Live Q&A Tutorial: Radiation Modelling and Effects on Electronic Devices with SPENVIS
10:15 AM 1:15 PM 7:15 PM
10:30 AM 1:30 PM 7:30 PM Live Exhibitor Break
10:45 AM 1:45 PM 7:45 PM
11:00 AM 2:00 PM 8:00 PM Live Batch Release 2 Intro
11:15 AM 2:15 PM 8:15 PM Pre-Recorded, On-Demand Batch release 2:
FPGAs, PLD, and New devices (4 talks) and Environments (4 talks)
11:30 AM 2:30 PM 8:30 PM
11:45 AM 2:45 PM 8:45 PM
12:00 PM 3:00 PM 9:00 PM
12:15 PM 3:15 PM 9:15 PM
12:30 PM 3:30 PM 9:30 PM
12:45 PM 3:45 PM 9:45 PM
1:00 PM 4:00 PM 10:00 PM
1:15 PM 4:15 PM 10:15 PM
1:30 PM 4:30 PM 10:30 PM
1:45 PM 4:45 PM 10:45 PM Pre-Recorded with Live Q&A Tutorial: Radiation Induced Single-Event Effects, Experience and Lessons Learned
2:00 PM 5:00 PM 11:00 PM
2:15 PM 5:15 PM 11:15 PM
2:30 PM 5:30 PM 11:30 PM Live - Exhibitor Booths

Exhibitor Webinars / Demos

2:45 PM 5:45 PM 11:45 AM
3:00 PM 6:00 PM 12:00 AM
3:15 PM 6:15 PM 12:15 AM
3:30 PM 6:30 PM 12:30 AM    


  Session  Title Presenter Affiliation 
Batch Release 1 Heavy Ion and Proton Facilities Radiation Effects Testing with Protons in Knoxville, Tennessee Vladimir (Laddie) Derenchuk ProNova Solutions, LLC
Challenges of Creating and Operating an SEE Testing Program at a Medical Proton Center Steve Laub Northwestern Medicine Proton Center
ECR Ion Source Upgrades at the Cyclotron Institute at Texas A&M University Henry Clark Cyclotron Institute at Texas A&M University
Common Issues Surrounding Heavy Ion Test Facilities and Users Pepito Thelly Texas A&M University
The Use of High Energy Heavy Ion Facilities: A Perspective on Return on Investment (ROI) Kenneth LaBel Science Systems and Applications, Inc.
Proposed High Energy Effects Test Facility at Brookhaven National Laboratory K. A. Brown Brookhaven National Lab
On-Orbit Radiation Experiments Data Analysis of a memory Single Event Effect experiment in Geostationary orbit Christian Poivey ESA
Implementation of a Radiation Detector Based on SRAM-based FPGAs on TAUSAT-1 Nano-satellite Eitan Keren MMG
Tutorial Radiation modelling and effects on electronic devices with SPENVIS Erwin De Donder Royal Belgian Institute for Space Aeronomy
Batch Release 2 FPGAs/SoCs, PLDs, and New Devices Comparing A5 SEE Faults in Various Hardware Steven Guertin NASA JPL
CAES Space Memory Roadmap Anthony Jordan CAES
Xilinx accelerated SEE test methodology for ISO-26262 functional safety certification Yanran Chen Xilinx, Inc.
Preliminary Results from Single-Event Characterization of the 7nm Xilinx Versal ACAP in Heavy-Ion Irradiation David Lee Sandia National Laboratories
Environments NAIRAS Model Characterization of the LEO Environment for the Assessment of SEE Radiation Risks Christopher Mertens NASA Langley Research Center
An Assessment of Space Weather Architectures to Support Deep Space Exploration Joseph Minow NASA Marshall Space Flight Cetner
SIRE2 Toolkit Update Zachary Robinson Fifth Gait Technologies
Evaluating SEE Rate Prediction Methods for Complex Devices Brian Sierawski Vanderbilt University
Tutorial Radiation Induced Single-Event Effects: Experiences and Lessons Learned Stephen Buchner Naval Research Laboratory
Webinar/Demo TBD    
Wednesday, September 1
PDT EDT Paris Experience Event
6:30 AM 9:30 AM 3:30 PM Live Exhibitor Breakfast
6:45 AM 9:45 AM 3:45 PM
7:00 AM 10:00 AM 4:00 PM Live Morning Welcome and Announcements
7:15 AM 10:15 AM 4:15 PM Live Batch Release 3 Intro
7:30 AM 10:30 AM 4:30 PM Pre-Recorded, On-Demand Batch release 3:
Laser and X-Ray Facilities and Guidelines (6 talks) and Learning and Development (3 talks)
7:45 AM 10:45 AM 4:45 PM
8:00 AM 11:00 AM 5:00 PM
8:15 AM 11:15 AM 5:15 PM
8:30 AM 11:30 AM 5:30 PM
8:45 AM 11:45 AM 5:45 PM
9:00 AM 12:00 PM 6:00 PM
9:15 AM 12:15 PM 6:15 PM
9:30 AM 12:30 PM 6:30 PM Live Q&A Heavy Ion and Proton Facilities
9:45 AM 12:45 PM 6:45 PM Live Q&A On-Orbit Radiation Experiments
10:00 AM 1:00 PM 7:00 PM Live (REMO) Exhibitor Reception
10:15 AM 1:15 PM 7:15 PM
10:30 AM 1:30 PM 7:30 PM
10:45 AM 1:45 PM 7:45 PM
11:00 AM 2:00 PM 8:00 PM
11:15 AM 2:15 PM 8:15 PM
11:30 AM 2:30 PM 8:30 PM Live Q&A FPGAs, PLDs, and New Devices
11:45 AM 2:45 PM 8:45 PM Live Q&A Environments
12:00 PM 3:00 PM 9:00 PM Live Batch Release 4 Intro
12:15 PM 3:15 PM 9:15 PM Pre-Recorded, On-Demand Batch release 4:
Radiation Hardness Assurance (6 talks) and FPGA Assurance (4 talks)
12:30 PM 3:30 PM 9:30 PM
12:45 PM 3:45 PM 9:45 PM
1:00 PM 4:00 PM 10:00 PM
1:15 PM 4:15 PM 10:15 PM
1:30 PM 4:30 PM 10:30 PM
1:45 PM 4:45 PM 10:45 PM
2:00 PM 5:00 PM 11:00 PM
2:15 PM 5:15 PM 11:15 PM Live Poster Session Intro
2:30 PM 5:30 PM 11:30 PM Live (Zoom Room for Each Poster Presenter) Poster Session
2:45 PM 5:45 PM 11:45 PM
3:00 PM 6:00 PM 12:00 AM
3:15 PM 6:15 PM 12:15 AM
3:30 PM 6:30 PM 12:30 AM


  Session  Title Presenter Affiliation 
Batch Release 3 Laser and X-Ray Facilities & Testing One and Two Photon Absorption Laser Scanning Test Facility with Fine Beam Motion and Temperature Control Li Chen University of Saskatchewan
See Testing Using a Mopa Laser With a 1030nm Emission Rez Mani Allied Scientific Pro
Development and Current Status of a Laser Test Guidelines Document Dale McMorrow Naval Research Laboratory
The Evolution of Laser/Ion Correlation in Single-Event Effects Joel Hales Naval Research Laboratory
Laser-Based Testing for Part Selection for Space Missions Dale McMorrow Naval Research Laboratory
Angle Dependence of Focused X-Ray-Induced Single Event Transients Kaitlyn Ryder NASA Goddard Space Flight Center
Learning & Development Training the Next-Generation Radiation Effects Test Engineer Daniel Loveless University of Tennessee - Chattanooga 
RADNEXT Ruben Garcia Alia CERN
NESC RHA Guidelines - Philosophy / Overview / Analysis Ray Ladbury NASA Goddard Space Flight Center
NESC RHA Guidelines - Testing / TAMU Bootcamp Testing Michael Campola & Greg Allen NASA Goddard Space Flight Center & NASA JPL
Batch Release 4 Radiation Hardness Assurance Propagating Single-Event Effects Across Levels of System Model Abstraction Chris Watkins Vanderbilt University
Radiation Testing in the Era of pLEO and COTS Scott Davis Aerospace Corporation
Alternate Approach to Radiation Hardening to Mitigate SEE in SoCs Using Low-Cost Non-COTS Parts David Gifford VORAGO Technologies
Connecting Mission Profiles and Radiation Vulnerability Assessment Richard Nederlander Vanderbilt University
Model and Testing-Based Assurance of COTS Systems in Space Radiation Environments Arthur Witulski Vanderbilt University
Smallsat Mission Assurance: Lessons Learned, Lessons Applied through Integration & Test Jeffrey Kelley Blue Canyon Technologies
FPGA Assurance Protecting Reconfigurable FPGAs from Malicious Bitstreams Salam Zantout The Aerospace Corporation
Patchable Hardware Security Module (PHaSM) for Extending FPGA Root-of-Trust Capabilities Grant Skipper Naval Surface Warfare Center Crane
Automatic Resynchronization of TMR-ed Asynchronous FIFOs Patrick Fleming Raytheon Intelligence & Space
Post-Radiation Testing Fault Injection for FPGA RISC-V SOC System Andrew Wilson Brigham Young University
  Poster Session Total Ionizing Dose Test Campaign with Lattice Semiconductor 28nm FD-SOI FPGA Jim Tavacoli Lattice Semiconductor
Domestic Proton Access Update Kenneth LaBel SSAI - NASA/GSFC
State of Domestic Heavy-Ion Facilities Jonathan Pellish NASA/GSFC
CHARM Ruben Garcia Alia CERN
Single Event Effects Characterization of a 1.25Gbps LVDS Repeater Aaron Turnbull CAES
Thursday, September 2
PDT EDT Paris Experience Event
6:30 AM 9:30 AM 3:30 PM Live Exhibitor Breakfast
6:45 AM 9:45 AM 3:45 PM
7:00 AM 10:00 AM 4:00 PM Live Morning Welcome and Announcements
7:15 AM 10:15 AM 4:15 PM Live Batch Release 5 Intro
7:30 AM 10:30 AM 4:30 PM Pre-Recorded, On-Demand Batch release 5:
Artifical Intelligence and Machine Learning (4 talks) and Designing with FPGAs (5 talks)
7:45 AM 10:45 AM 4:45 PM
8:00 AM 11:00 AM 5:00 PM
8:15 AM 11:15 AM 5:15 PM
8:30 AM 11:30 AM 5:30 PM
8:45 AM 11:45 AM 5:45 PM
9:00 AM 12:00 PM 6:00 PM
9:15 AM 12:15 PM 6:15 PM
9:30 AM 12:30 PM 6:30 PM Live Q&A Laser and X-Ray Facilities and Guidelines
9:45 AM 12:45 PM 6:45 PM Live Q&A Learning and Development
10:00 AM 1:00 PM 7:00 PM Live Exhibitor Break
10:15 AM 1:15 PM 7:15 PM
10:30 AM 1:30 PM 7:30 PM Live Invited Talk: Tamitha Skov
(Space Weather Woman)
10:45 AM 1:45 PM 7:45 PM
11:00 AM 2:00 PM 8:00 PM
11:15 AM 2:15 PM 8:15 PM
11:30 AM 2:30 PM 8:30 PM Live Exhibitor Break
11:45 AM 2:45 PM 8:45 PM
12:00 PM 3:00 PM 9:00 PM Live Q&A Radiation Hardness Assurance
12:15 PM 3:15 PM 9:15 PM Live Q&A FPGA Assurance
12:30 PM 3:30 PM 9:30 PM Pre-Recorded with Live Q&A Invited Talk: Kevin Morris
12:45 PM 3:45 PM 9:45 PM
1:00 PM 4:00 PM 10:00 PM
1:15 PM 4:15 PM 10:15 PM Live Q&A Artificial Intelligence and Machine Learning
1:30 PM 4:30 PM 10:30 PM Live Q&A Designing with FPGAs
1:45 PM 4:45 PM 10:45 PM Live Panel Discussion: Heavy-ion SEE Testing
2:00 PM 5:00 PM 11:00 PM
2:15 PM 5:15 PM 11:15 PM
2:30 PM 5:30 PM 11:30 PM Live - Exhibitor Booths Exhibitor Webinars / Demos
2:45 PM 5:45 PM 11:45 AM
3:00 PM 6:00 PM 12:00 AM
3:15 PM 6:15 PM 12:15 AM
3:30 PM 6:30 PM 12:30 AM


  Session  Title Presenter Affiliation 
Batch Release 5 Artificial Intelligence / Machine Learning Towards AI-Based Mitigation of SEE Daniel Loveless University of Tennessee - Chattanooga 
Using Machine Learning to Calculate Proton Cross-Sections from Heavy-Ion Data David Hansen Space Micro
Machine Learning -based EEG Data for Autonomous Weapons: Preliminary Study Lucien Ngalamou Lewisu University
High Performance FPGA Processor Platform for Artificial Intelligence Data Processing Joaquin Espana Navarro CAES Gaisler AB
Designing with FPGAs/SoCs and PLDs DESIGN AND SIMULATION OF BITCOIN MINING AND IMPLEMENTATION ON THE ZYBO Z7-20 FPGA Mohamed El-Hadedy California Polytechnic University
Reco-GAGE: A Reconfigurable Lightweight GAGE hash function engine for IoT devices Mohamed El-Hadedy California Polytechnic University
A Reconfigurable SP-SVPWM for DC to AC Conversion Lucien Ngalamou Lewisu University
Approaches for FPGA Design Assurance Jeff Goeders Brigham Young University
Enabling new applications on Mars through reconfigurable coprocessing Jim Butler NASA JPL
Invited Talk   Kevin Morris  
Panel Discussion Heavy-ion SEE Testing Michael Campola, Greg Allen, and Henry Clark NASA/GSFC; NASA/JPL; Texas A&M

2021 SEE/MAPLD - Invited Speakers and Tutorial Sessions:


Invited Speaker - Thursday Morning

Thursday, September 2, 10:30AM PDT


Details Forthcoming

 

 


Dr. Tamitha Skov

Research Scientist
The Aerospace Corporation

We are pleased to announce that Dr. Tamitha Skov, known by many as Space Weather Woman, will be joining us live on Thursday, September 2nd, at 10:30AM PDT. Stay tuned for further details.
Invited Speaker - Thursday Afternoon

Thursday, September 2, 12:30PM PDT


Details Forthcoming

 

 


Kevin Morris

President
Techfocus Media, Inc.

Kevin founded Techfocus Media in 2003. Techfocus Media are the publishers of EE Journal, FPGA Journal, Embedded Technology Journal, IC Design and Verification Journal, and other industry trade publications.

He is currently president of Techfocus Media and editor-in-chief of EEJournal.com .
Tutorial Session 1

Tuesday, August 31

10:00 AM PDT

 

Radiation Modelling and Effects on Electronic Devices with SPENVIS

Erwin De Donder

Royal Belgium Institute for Space Aeronomy

Tutorial Session 2

Tuesday, August 31

1:45 PM PDT

 

Radiation Induced Single-Event Effects, Experience and Lessons Learned

Stephen Buchner

Naval Research Laboratory

Panel Discussion

Thursday, September 2

1:45 PM PDT

 

Heavy Ion Single Event Effects (SEE) Testing

Greg Allen, NASA Jet Propulsion Laboratory
Michael Campola, NASA Goddard Space Flight Center


Supporter/Exhibitor and Exhibitor Benefits:
  • You will receive our SEE/MAPLD Attendee List two weeks prior to the Event
    (only Attendees who mark to be on the Attendee List will appear)
  • Webinar slot (20-minute time) to promote your products from your Virtual Exhibit
  • Supporter/Exhibitor Brochure, with 50 word company description, posted on SEE/MAPLD web and during the Virtual Event
  • We will provide an email to attendees highlighting Supporters/Exhibitors one week before and one month after.
  • All Supporter/Exhibitors receive a Double Virtual Booth


Welcome Our 2021 Exhibitors

2021 SEE/MAPLD Virtual Supporter/Exhibitor Registration is open. Click here for details



Please contact Teresa Farris if you have any questions.

Teresa Farris
Archon, LLC
Teresa.Farris@archon-llc.com

Supporters / Exhibitors
3D Plus Logo

3D Plus
contact: Marilou Delacruz
phone: 510-824-5591
email: mdelacruz@3d-plususa.com
web: www.3d-plususa.com


CAES Logo




CAES
contact: Lauren Cyran
phone: 719-437-9191
email: to lauren.cyran@caes.com
web: www.caes.com
Renesas Electronics America Logo
Renesas Electronics America
contact: Kiran Bernard
phone: 321-724-7247
email: kiran.bernard.jy@gr.renesas.com
web: www.renesas.com
Topline Logo
TopLine
contact: Martin Hart
email: info@topline.tv
phone: 800-776-9888
web: www.topline.tv

VORAGO Technologies
VORAGO Technologies
contact: Jen Quinonez
phone: 512-633-7992
email: Jenq@voragotech.com
web: www.voragotech.com
Northwestern Medicine Proton Center Logo

Northwestern Medicine Proton Center
contact: Steve Laub
email: steven.laub@nm.org
phone: 630-821-6376
web: www.protoncenter.nm.org
   
Exhibitors

ProNova Logo
ProNova Solutions
contact: Jewell Overton
email: jewell.overton@pronovasolutions.com
phone: 865-770-7000
web: www.pronovasolutions.com

Flex Logix Logo
Flex Logix
contact: Andy Jaros
phone: 925-785-3016
email: andy@flex-logix.com
web: www.flex-logix.com
Triad Semiconductor Logo

Triad Semiconductor
contact: Jim Kemerling
phone: 336-774-2150
email: jkemerling@triadsemi.com
web: https://www.triadsemi.com
Allied Scientific Pro Logo

Allied Scientific Pro
contact: Steeve Lavoie
phone: 800-253-4107
email: sales@alliedscientificpro.com
web: www.alliedscientificpro.com

Ultra Tec Logo
ULTRA TEC
contact: Tim Hazeldine
phone: 714-542-0608
email: tim@ultratecusa.com
web: www.ultratecusa.com

Avalanche Technology Logo
Avalanche Technology
contact: Paul Armijo
phone: 510-897-3300
email: info@avalanche-technology.com
web: www.avalanche-technology.com

2021 SEE/MAPLD Workshop Registration Process

Ground Rules For All Attendees
Attendee registration is open from May 7 to November 30, 2021

Attendees will receive an instructional email from "SEE/MAPLD 2021"
Online Event URL: https://www.engagez.net/SEEMAPLD2021

Please watch for this prior to the event!

Registrations cannot be shared
Registration for Attendees and Exhibitors

Registration Option Fee
Virtual Full Admission $325.00
Virtual Full Admission: Full-Time Retiree $100.00
Virtual Full Admission: Full-Time Student $50.00
Note: There is no Guest Registration for 2021
Contact Teresa.Farris@archon-llc.com if you have any questions!

ALL Attendees and Exhibitors: CLICK HERE to Register

Registration for Supporter/Exhibitors and Exhibitors

SEE/MAPLD offers a Supporter/Exhibitor and Exhibitor category for the Virtual Event!
SEE/MAPLD Virtual Supporter/Exhibitor is $2000 with 4 Virtual Full Admission Registrations
and 10 passes to attend the Virtual Exhibits (to be used for customers or staff)

SEE/MAPLD Virtual Exhibitor is $1000 with 2 Virtual Full Admission Registrations.
10 passes to attend the Virtual Exhibits (to be used for customers or staff)
may be purchased for $250

Please see the Exhibitor Page for more benefits!

Virtual Supporter/Exhibitor and Exhibitor Registration ends on August 2, 2021

There are no refunds for the 2021 SEE/MAPLD Virtual Event


 

Not applicable for 2021 - The SEE/MAPLD Combined Workshop will be a hosted in a virtual format

Previous SEE Symposium and SEE/MAPLD Home Pages: 2011, 2012, 2013, 2014, 2015, 2016, 2017, 2018, 2019, 2020

SEE Symposium and SEE/MAPLD Presentation Materials 2006-2019

Contact Us

General Chair(s): SEE: Megan Casey, NASA Goddard Space Flight Center / MAPLD: Nadia Rezzak, Microchip Technology and Pierre Maillard, Xilinx, Inc.
Technical Program Chair(s): SEE: Rebekan Austin, NASA Goddard Space Flight Center and Steven LaLumondiere, The Aerospace Corporation / MAPLD: Tyler Lovelly, Air Force Research Laboratory
Poster Session Chairwoman: Martha O'Bryan, SSAI / NASA Goddard Space Flight Center
Industrial Exhibit Chairwoman: Teresa Farris, Archon, LLC
Local Arrangements & Registration Services: TBD
Website Curator: Carl Szabo, SSAI / NASA Goddard Space Flight Center

SEE/MAPLD Code of Conduct

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