SEE/MAPLD Combined Workshop Banner

Welcome to the 32nd Edition of the Single Event Effects (SEE) Symposium
coupled with the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop

We are returning to La Jolla, CA!
May 15th - 19th, 2023
For an in-person event

Our workshop will feature content including, but not limited to, the following areas:

Artificial intelligence & machine learning (AI / ML)

Continuing education & workforce development

Designing with field programmable gate arrays (FPGAs) / systems on a chip (SoCs) / new devices

FPGA & SoC assurance

Guidelines and standards

On-orbit experiments & model validation

Radiation hardness assurance (RHA)

SEE test facilities

SEE in devices & circuits / mechanisms & modeling

Space environments

Visit Our Presentation Archive!
Featuring over 700 talks spanning years 2006-2020
Jump to the Archives

2023 SEE Symposium/MAPLD Workshop Health Protocols

The 2023 SEE Symposium/MAPLD Workshop will be held as an in-person event on 15-19 May 2023 at the La Jolla Marriott Hotel.

The SEE Symposium/MAPLD Workshop will follow the health regulations of San Diego County and the State of California in regard to Covid-19, the flu, and other contagious diseases. Please note that this policy is subject to change as health recommendations and current conditions evolve. Masks are not required at this time, but we encourage attendees to make an informed decision based on being in close proximity to a large body of people. Note that if conditions change at the time of the meeting, we will communicate any required changes

If you have Covid-19, the flu, or any other contagious disease, do not attend the meeting. Anyone who tests positive for Covid-19 within 10 days of the meeting should not attend the meeting, unless they have subsequently tested negative for Covid-19. If you test positive for Covid-19 or any other contagious disease (including the flu) during the meeting, you should notify the meeting organizers and leave the meeting immediately.

Refunds of registration fees or exhibitor fees that are requested due to Covid-19, the flu, or other contagious disease will be processed on a case by case basis with a possible deduction to cover our costs for registration. Refund requests must be made in a timely manner.”

2023 SEE/MAPLD Workshop Call for Papers

We are seeking contributions in the following areas, but all submissions will be reviewed. Four sessions are available: SEE, MAPLD, Combined, and Poster. The Combined Session includes submissions that cross SEE and MAPLD themes. The Poster Session can include SEE, MAPLD, or Combined content. Please refrain from technical content reasonably classified as product marketing.

We especially encourage the submission of content focusing on:
1) Standards & Methods 4) Modeling and Simulation
2) Alternatives to Heavy Ion and Proton Testing 5) Relevant Test Facility Updates
3) Space Environments

Abstract Submission Guidelines:

Abstract submissions are a minimum of 1 and a maximum of 4 pages for MS Word

PowerPoint charts should provide a title page with authors and affiliations, motivation / context / overview, available relevant results, and anticipated conclusions

The required file format is MS Word .docx or MS Powerpoint .pptx or Adobe PDF (refer to templates provided below)

MS Word DOCX abstract template (.docx)

MS Powerpoint PPTX abstract template (.pptx)

Deadline for submissions date coming soon.

SEE Symposium / Combined* / MAPLD Session Options
New! Artificial Intelligence (AI) / Machine Learning (ML) in FPGAs/SoCs: AI / ML design considerations for reliable terrestrial, avionic, and aerospace applications; using AI for SEE mitigation; SEE evaluation of designs leveraging AI / ML
Phenomena: Upsets, Functional Interrupts, Transients, Latchup, Gate Rupture, Burnout, etc. FPGAs/SoCs, PLDs, and New Devices: New and/or novel FPGA and PLDs; Benchmarking of FPGAs and PLDs; Applications of space-borne processing.
Basic Mechanisms and Modeling: Destructive and Non-Destructive Effects, Nanoscale Phenomena, Charge Transport and Collection, Impact of Circuit and Environmental Parameters, etc. Mitigation of Single event effects in FPGAs/SoCs, PLDs, and commercial electronics: Multi-level approaches for high reliability and fault tolerance (redundancy, TMR, SET filtering, etc…), upset mitigation techniques and automated tools, etc.
SEE Mitigation Methods Including Radiation Hardened by Design (RHBD) and by Process (RHBP): Approaches for gaining SEE hardness in commercial devices, etc. Designing with FPGAs/SoCs, and PLDs: agile methods, ESL/HLS and model-based engineering techniques, embedded processing, and synthesis efficiency improvements.
Environments and Facilities: Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Pulsed Laser Test Facilities. Validation and Verification of FPGAs/SoCs, and PLDs: Verification techniques and languages such as co-simulation, System Verilog and OVM/UVM. Simulation speed-up techniques, emulation, new tools and methods for design validation.
Operational Regimes and Performance Data: Systems and Devices from LEO to Interplanetary, High Altitude Aircraft, and Terrestrial. Availability/Reliability/Susceptibility of programmable devices: Failure mechanisms, reliability testing and characterization, packaging reliability, reliable design practices.
Electronic & Photonic Device Data and Measurement Techniques: Memories, Analog/Digital Circuits, systems-on-chip (SoCs), Field Programmable Gate Arrays (FPGAs), Optocouplers, Photonic Integrated Circuits, Power Converters, Sensors, etc. Novel Applications and Case Studies: Reconfigurable computing, high-performance processing using programmable logic, successful deployment of programmable logic, etc.
Systems and Error Rate Computation: Error Mitigation, Error Detection & Correction, Multi-core Processing, and Fault Tolerant Systems; Analytic, Monte Carlo, Mixed-Level, methods, etc. Technical Management of FPGAs and PLDs: Technical leadership, process management and metrics.
Education: Education Practices, Market Demands for Military and Aerospace Component Engineers, and Engineer Retention.
*All options subject to change any time, per the discretion of the conference committee
Monday, May 15, 2023 - Welcome to the SEE/MAPLD Workshop
Time (PST) Session Speaker

Program coming soon.
End of Activities for Monday
Tuesday, May 16, 2023 - Single Event Effects (SEE) Sessions
Time (PST) Session Speaker
Schedule coming soon.
Wednesday, May 17, 2023 - Single Event Effects (SEE) Sessions
Time (PST) Session Speaker
Schedule coming soon.
Thursday, May 18, 2023 - Single Event Effects (SEE) Sessions
Time (PST) Session Speaker
Schedule coming soon.
Friday, May 18, 2023 - Single Event Effects (SEE) Sessions
Time (PST) Session Speaker
Schedule coming soon.

Details about 2023 SEE/MAPLD Invited Speakers and/or Tutorial Sessions coming soon

2023 Exhibitor Registration is coming soon.

Please contact Teresa Farris if you have any questions.

Teresa Farris
Archon, LLC

2023 SEE/MAPLD Workshop - Registration Information
Registration Information coming soon.

Exhibitor-Specific Registration Details coming soon

Hotel Reservation

Hotel Information coming soon.

The Workshop Block of Hotel Reservations for the
2023 SEE/MAPLD Workshop at the La Jolla, CA Marriott is coming soon.
Room Block will open when Technical Registration opens.

Please contact for assistance

Previous SEE Symposium and SEE/MAPLD Home Pages: 2011, 2012, 2013, 2014, 2015, 2016, 2017, 2018, 2019, 2020, 2021 2022

SEE Symposium and SEE/MAPLD Presentation Materials 2006-2022

Contact Us

General Chair(s): SEE: Daniel Loveless, University of Tennessee at Chattanooga / MAPLD: Matthew Cannon, Sandia National Laboratories
Technical Program Chair(s): SEE: Adrian Ildefonso, Naval Research Laboratory / MAPLD: Paul Armijo, Armijo Innovations LLC
Tutorial Chair: Dave Hansen, Space Micro
Poster Session Chair: Martha O'Bryan, SSAI / NASA Goddard Space Flight Center
Exhibits Chair: Teresa Farris, Archon, LLC
Meeting Planner: Archon, LLC
Website Curator: Carl Szabo, SSAI / NASA Goddard Space Flight Center

SEE/MAPLD Code of Conduct