SEE/MAPLD Workshop Banner

Welcome to the 31st Edition of the Single Event Effects (SEE) Symposium
coupled with the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop

We are returning to La Jolla, CA!
May 15th - 19th, 2022
For an in-person event


Our workshop will feature content including, but not limited to, the following areas:

Artificial intelligence & machine learning (AI / ML)

Continuing education & workforce development

Designing with field programmable gate arrays (FPGAs) / systems on a chip (SoCs) / new devices

FPGA & SoC assurance

Guidelines and standards

On-orbit experiments & model validation

Radiation hardness assurance (RHA)

SEE test facilities

SEE in devices & circuits / mechanisms & modeling

Space environments



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Featuring over 700 talks spanning years 2006-2020
Jump to the Archives


Official SEE/MAPLD COVID-19 Policy:
 

Health and safety of our attendees and staff are our first priorities

As previously stated, all attendees and their guest should be fully vaccinated as per CDC definition as of 4/1/2022

  • No records are being kept of attendee vaccination status and fully vaccinated attendees will simply be required to show hardcopy or electronic (phone) copy of their vaccination record at SEEMAPLD registration desk for badge pickup
  • No face mask is required if an individual is fully vaccinated, however, face masks are strongly encouraged as per the CDC for indoor events

Individuals should not enter the venue if experiencing any flu-like symptoms or feeling ill

Accommodations as per federal regulations are available for religious and medical exemptions:

  • Exemptions should be requested at least one week prior to on-site arrival via electronic or hardcopy requests
  • Medical exemptions require appropriate attestation letter by a medical professional (M.D., D.O., P.A., nurse practitioner, nurse, or equivalent)
  • Exempted individuals are also required to provide results of a COVID-19 test taken either 48 hours prior (PCR type test) or 24 hours prior (antigen type test) to start of the event (or attendee/individual arrival date)
    • If the individual has been diagnosed with COVID-19 within 90 days of the event start, test results are not required. In this case, false positives may occur and an attestation from a relevant medical professional stating the diagnosis and date is required
    • Negative results should be provided by the exempted individual at the meeting registration desk prior to entering the event venue
    • Exempted individuals are required to wear masks in all meeting areas except while actively eating or drinking

This COVID-19 policy is subject to change as the pandemic evolves or new guidance becomes available

This policy is compliant with federal and local government medical privacy regulations

2022 SEE/MAPLD Workshop Call for Papers


We are seeking contributions in the following areas, but all submissions will be reviewed. Four sessions are available: SEE, MAPLD, Combined, and Poster. The Combined Session includes submissions that cross SEE and MAPLD themes. The Poster Session can include SEE, MAPLD, or Combined content. Please refrain from technical content reasonably classified as product marketing.

We especially encourage the submission of content focusing on:
1) Standards & Methods 4) Modeling and Simulation
2) Alternatives to Heavy Ion and Proton Testing 5) Relevant Test Facility Updates
3) Space Environments


Abstract Submission Guidelines:


Abstract submissions are a minimum of 1 and a maximum of 4 pages for MS Word

PowerPoint charts should provide a title page with authors and affiliations, motivation / context / overview, available relevant results, and anticipated conclusions

The required file format is MS Word .docx or MS Powerpoint .pptx or Adobe PDF (refer to templates provided below)

MS Word DOCX abstract template (.docx)

MS Powerpoint PPTX abstract template (.pptx)


Deadline for submissions has passed; Submission page is now closed.

SEE Symposium / Combined* / MAPLD Session Options
New! Artificial Intelligence (AI) / Machine Learning (ML) in FPGAs/SoCs: AI / ML design considerations for reliable terrestrial, avionic, and aerospace applications; using AI for SEE mitigation; SEE evaluation of designs leveraging AI / ML
Phenomena: Upsets, Functional Interrupts, Transients, Latchup, Gate Rupture, Burnout, etc. FPGAs/SoCs, PLDs, and New Devices: New and/or novel FPGA and PLDs; Benchmarking of FPGAs and PLDs; Applications of space-borne processing.
Basic Mechanisms and Modeling: Destructive and Non-Destructive Effects, Nanoscale Phenomena, Charge Transport and Collection, Impact of Circuit and Environmental Parameters, etc. Mitigation of Single event effects in FPGAs/SoCs, PLDs, and commercial electronics: Multi-level approaches for high reliability and fault tolerance (redundancy, TMR, SET filtering, etc…), upset mitigation techniques and automated tools, etc.
SEE Mitigation Methods Including Radiation Hardened by Design (RHBD) and by Process (RHBP): Approaches for gaining SEE hardness in commercial devices, etc. Designing with FPGAs/SoCs, and PLDs: agile methods, ESL/HLS and model-based engineering techniques, embedded processing, and synthesis efficiency improvements.
Environments and Facilities: Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Pulsed Laser Test Facilities. Validation and Verification of FPGAs/SoCs, and PLDs: Verification techniques and languages such as co-simulation, System Verilog and OVM/UVM. Simulation speed-up techniques, emulation, new tools and methods for design validation.
Operational Regimes and Performance Data: Systems and Devices from LEO to Interplanetary, High Altitude Aircraft, and Terrestrial. Availability/Reliability/Susceptibility of programmable devices: Failure mechanisms, reliability testing and characterization, packaging reliability, reliable design practices.
Electronic & Photonic Device Data and Measurement Techniques: Memories, Analog/Digital Circuits, systems-on-chip (SoCs), Field Programmable Gate Arrays (FPGAs), Optocouplers, Photonic Integrated Circuits, Power Converters, Sensors, etc. Novel Applications and Case Studies: Reconfigurable computing, high-performance processing using programmable logic, successful deployment of programmable logic, etc.
Systems and Error Rate Computation: Error Mitigation, Error Detection & Correction, Multi-core Processing, and Fault Tolerant Systems; Analytic, Monte Carlo, Mixed-Level, methods, etc. Technical Management of FPGAs and PLDs: Technical leadership, process management and metrics.
Education: Education Practices, Market Demands for Military and Aerospace Component Engineers, and Engineer Retention.
*All options subject to change any time, per the discretion of the conference committee
Sunday, May 15, 2022 - Welcome to the SEE/MAPLD Workshop
Time (PST) Session Speaker
5:30 PM

8:00 PM
Workshop Registration and Registration Reception
5:30 - 8:00 PM
Soledad Ballroom
End of Activities for Sunday
Monday, May 16, 2022 - Single Event Effects (SEE) Sessions
Time (PST) Session Speaker
7:00 AM  
Registration in Salon A Foyer: 7:00AM - 4:30PM
Breakfast 7:00AM - 9:00AM
8:00 AM
Intro
Workshop Opening Remarks

Rebekah Austin, NASA/GSFC; Steve LaLumondiere, The Aerospace Corporation; Tyler Lovelly, AFRL

SEE Technical Program Introduction

Chair: Daniel Loveless, University of Tennessee at Chattanooga
8:10 AM
Tutorial
Introduction to Tutorials

Chair: Milton Diaz, SRI International
8:20 AM
 
Tutorial 1: The Cost of a Beam Hour

Henry Clark, Texas A&M
8:45 AM
 
Tutorial 2: Cost Factors Associated with an SEE Test

Ted Wilcox, NASA/GSFC
9:10 AM
 
Tutorial 3: SEE Test Services Costs and Considerations:
From Running the Beam to Complete Turnkey SEE Testing

Mike Tostanoski, Radiation Test Solutions
9:35 AM
 
Tutorial 4: Characterizing Commercial SoC (System on Chip)
FPGAs for Potential Space Use

Allyson Yarbrough, The Aerospace Corporation
10:00 AM BREAK: 30 Minutes
10:30 AM
Session A
Introduction to Environments and Facilities Session

Chair: Justin Likar, Johns Hopkins University Applied Physics Laboratory
10:40 AM
 
DoD and Heavy Ion SEE Facilities

Courtney Matzkind, Missile Defense Agency
11:00 AM
 
A New Heavy Ion Single-Event Effects Test Facility
at Michigan State University

Steve Lidia, Michigan State University
11:20 AM
 
LBNL 88-Inch Cyclotron BASE Facility 2022 Update

Alexander Donoghue, Lawrence Berkeley National Laboratory
11:40 AM LUNCH: 1 Hour 30 Minutes
1:10 PM
 
ESA Update on European Irradiation Facilities

Anastasia Pesce, ESA
1:30 PM
 
Future Options with Proton Facilities

Ken LaBel, SSAI@NASA/GSFC
1:50 PM
 
Status of the High Energy Effects Test Facility Project at Brookhaven National Laboratory

Kevin Brown, Brookhaven National Laboratory
2:10 PM
 
Heavy Ion and Proton Testing at Texas A&M University

Henry Clark, Texas A&M University
2:30 PM
 
The RADNEXT Facility Network and Related SEE
Irradiation Opportunities

Mario Sacristán Barbero, CERN
2:50 PM BREAK: 30 Minutes
3:20 PM
Panel
Panel Discussion: Optical/Photonic Modeling

Moderator: Steve Moss, Scientist
Panelists

Todd Rose, The Aerospace Corporation; Robert Reed, Vanderbilt University;
Kaitlyn Ryder, NASA/GSFC; Alexandre LeRoch, NASA/GSFC
4:20 PM
Session B
Introduction to Laser Facilities and Testing Session

Chair: Alexandre LeRoch, NASA/GSFC
4:30 PM
 
Pulsed Laser SEE Test Guidelines Desk Reference - Update

Dale McMorrow, Naval Research Laboratory
4:50 PM
 
Development and Applications of NRL Laser Beam Line to Study Wide Bandgap Semiconductor Materials

Ani Khachatrian, Naval Research Laboratory
5:10 PM
 
Pulsed X-ray Single-Event Transient Measurements
on a PLL with Integrated VCO

Daniele Monahan, The Aerospace Corporation
5:30 PM
 
Not All Pulsed-Laser SEEs are Created Equal:
The Importance of Accurate Characterization and
Reporting of Pulsed-Laser Parameters

Adrian Ildefonso, Naval Research Laboratory
5:50 PM End of Monday Technical Sessions
End of Activities for Monday
Tuesday, May 17, 2022 - Single Event Effects (SEE) Sessions
Time (PST) Session Speaker
7:00 AM  
Registration in Salon A Foyer: 7:00AM - 4:00PM
Breakfast 7:00AM - 9:00AM
8:00 AM
Invited
Invited Talk: Thriving in a Male Dominated Profession

Minal Sawant, AMD
8:30 AM
Session C
Introduction to Education and Workforce Development Session

Chair: Deb Newberry, Newberry Technology Associates
8:40 AM
 
The SCALE Radiation Effects Workforce Development Program

Daniel Loveless, University of Tennessee at Chattanooga
9:00 AM
 
Texas A&M Master's Program

Henry Clark, Texas A&M University
9:20 AM
 
Texas A&M SEE Bootcamp Debrief

Michael Campola, NASA/GSFC
9:40 AM BREAK: 30 Minutes
10:10 AM
Panel
Workforce Development Panel:
What's Missing from the Way Forward?

Moderator: Greg Allen, NASA Jet Propulsion Laboratory

Panelists

Daniel Loveless, University of Tennessee; Michael Campola, NASA GSFC;
Allyson Yarbrough, The Aerospace Corporation; Vickie Wall, Versatile Workforce
11:10 AM
Invited
Invited Talk: 3D and Heterogeneous Integration Challenges

Anu Ramamurthy, Microchip
11:40 AM LUNCH: 1 Hour 20 Minutes
1:10 PM
Session D
Introduction to Electronic and Photonic Device Data,
Techniques, and Diagnostics Session

Chair: Adrian Ildefonso, Naval Research Laboratory
1:20 PM
 
Factors Affecting Single Event Effects (SEE)
Sensitivity of a Part: Evaluating Existing Information
Pre-Test to Determine Expectations

Ken LaBel, SSAI@NASA/GSFC
1:40 PM
 
Detection of Single Event Transients in Arbitrary Waveforms Using Statistical Window Analysis

Jake Carpenter, University of Tennessee at Chattanooga
2:00 PM
 
Risk-Driven and Mitigation-Focused SEFI Testing
of NAND Flash Devices

Ted Wilcox, NASA/GSFC
2:20 PM
 
The CERN R2E Project and SEEs in High-energy
Accelerator Applications

Mario Sacristán Barbero, CERN
2:40 PM BREAK: 30 Minutes
3:10 PM
Session E
Introduction to Advanced Devices and Integrated Circuits Session

Chair: Jason Riddley, NASA Jet Propulsion Laboratory
3:20 PM
 
22FDX Compiled SRAM Single Event Effects

Steven Guertin, NASA Jet Propulsion Laboratory
3:40 PM
 
Single Event Upset Response of 12LP FinFET Digital Circuits

Jereme Neuendank, Arizona State University
4:00 PM
 
RadHard Power ICs that Fit the Requirements,
Longevity and Costs for Satellites

Anton Quiroz, Apogee Semiconductor
4:20 PM End of Tuesday Technical Sessions - 1 Hour 10 Minute Break
5:30 PM

8:00 PM
Industrial Exhibit
5:30 - 8:00 PM
End of Activities for Tuesday
Wednesday, May 18, 2022 - Combined SEE/MAPLD Sessions
Time (PST) Session Speaker
7:00 AM  
Registration in Salon A Foyer: 7:00AM - 4:00PM
Breakfast 7:00AM - 9:00AM
8:00 AM
Invited
Invited Talk: How Nuclear Data is Prepared

Lee Bernstein, Lawrence Berkeley National Laboratory
8:40 AM
Session F
Introduction to Data Analysis and Event Rate Computation Session

Chair: Ian Troxel, Troxel Aerospace Industries, Inc.
8:50 AM
 
A Parametric Methodology for SEE Criticality Analysis

Michael Campola, NASA/GSFC
9:10 AM
 
A Modest Proposal for Weibull Fitting of SEE Datasets

Gary Swift, Swift Radiation & Radiation Services
9:30 AM
 
Interpreting Archival Cross-Section vs. LET Fit Parameters Based On Data Quality

Ray Ladbury, NASA/GSFC
9:50 AM BREAK: 30 Minutes
10:20 AM
 
Using Track-Structure Theory to Calculate Proton Cross-Sections from Heavy-Ion Data

David Hansen, Space Micro
10:40 AM
 
SIRE2 Toolkit Update

Zachary Robinson, 5th Gait Technologies
11:00 AM
Invited
Ingenuity and the Snapdragon - Results and Future Plans

Doug Sheldon, NASA Jet Propulsion Laboratory
11:50 AM LUNCH: 1 Hour 30 Minutes
1:20 PM
Session G
Introduction to Artificial Intelligence and Machine Learning Session

Chair: Evan Kain, Air Force Research Laboratory
1:30 PM
 
Ramon.Space RC64-based AI/ML Inference Engine

Lisa Kuo, Ramon Space
1:50 PM
 
Radical Thinking at Fundamental levels for AI Computation

Neil Sampson, GSI Technology
2:10 PM
 
Supervised Learning and Classification of Single-Event Transient Anomalies

Trevor Peyton, University of Tennessee at Chattanooga
2:30 PM BREAK: 30 Minutes
3:00 PM
Session H
Introduction to Circuits and Systems Session

Chair: Michael Pineiro, Raytheon
3:10 PM
 
GR765 LEON5FT System-on-Chip: Results of First STM 28nm Test Chip Radiation Test Campaign

Fabio Malatesta, Cobham Gaisler
3:30 PM
 
Proton Evaluation of Xilinx/AMD Versal 7nm for Space 2.0: Programmable Logic (PL), Processor (PS) and Internal Scrubber (XilSEM) Results

Pierre Maillard, AMD/Xilinx
3:50 PM
 
Bridging the Gap Between Commercial and High Rel RadHard Components

Anton Quiroz, Apogee Semiconductor
4:10 PM
 
Fault Propagation in Microprocessors

Stefania Esquer, Vanderbilt University
4:30 PM
 
Guideline for Raspberry Pis in Space

Steven Guertin, NASA Jet Propulsion Laboratory
4:50 PM
 
Data Center in Space: Cloud, Edge Computing and Big Data

Lisa Kuo, Ramon Space
5:10 PM End of Wednesday Technical Sessions - 20 Minute Break
5:30 PM
8:00 PM
Poster Session and Happy Hour
5:30 - 8:00 PM
Access for Testing Electronics at U.S. Proton Therapy Centers
is a Very Dynamic Business

Ken LaBel, SSAI@NASA/GSFC
NASA Space Radiation Laboratory at Brookhaven National Laboratory: A Unique Facility for Space-radiation Effect Studies

K. A. Brown, J. Gasparik, T. Olsen, C. Pearson, A. Rusek, M. Sivertz, Brookhaven National Laboratory
Single Event Effects and Total Dose Considerations
for NASA's Interstellar Probe Mission

J. J. Likar, M. Donegan, J. Porter, J. Kinnison, A. Haapala, The Johns Hopkins University Applied Physics Laboratory
NASA M-STAR 2021 Low Power Implementation of Flight Software

R. Herndon, Y. Zhang, D. Chiu, Princeton University;
B. Banta, M. Walker, D. Karthikeyan, G. Millan, A. Moussa, M. El-Hadedy, California State Polytechnic University
XTEA Encryption Comparison Using Arduino Uno and Raspberry Pi 3 B+

I. Elizarraz, G. Drumheller, A. Nguyen, A. S. Eddin, H. El-Naga, M. El-Hadedy, California State Polytechnic University
TEA Performance

S. Cady, R. Schwartz, S. Yu, A. S. Eddin, H. El-Naga, M. El-Hadedy, California State Polytechnic University
Hardware Benchmarking of Image Processing Using Alpha-Blended Images

D. Karthikeyan, E. Guzman, Y. Malik, H. El-Naga, A. S. Eddin, M. El-Hadedy, California State Polytechnic University
System on Chip: H.264 Video Compression With PYNQ Z1

M. Hicks, C. Duong, E. Hwang, A. S. Eddin, H. El-Naga, M. El-Hadedy, California State Polytechnic University
Reconfigurable Computing for Higher Orders S-Curve Motion Control

B. Tapia, B. J. Banta, H. Luc, S. D. Moore, J. A. Villegas, M. El-Hadedy, California State Polytechnic University
Are Cosmic Neutrons a Threat to Pacemakers?
Testing SRAMs With an Am-Be Neutron Source

M. Plettenberg, German Aerospace Center & Justus-Liebig University; M. M. Meier, K. Marsalek, K. Schennetten, German Aerospace Center;
H. Zaunick, K. Brinkmann, Justus-Liebig University
CCGA Solder Columns - Why They Are Needed for FPGA, ASIC and SOC Applications

Martin Hart, Teresa Farris, Topline Corporation
Functional Redundancy for Mitigation of SEE in Heterogeneous Computing Systems

S. Camp, J. Carpenter, T. Skjellum, D. Reising, T. D. Loveless, University of Tennessee at Chattanooga;
K. Linga, A. Raman, CFD Research Corporation
End of Activities for Wednesday
Thursday, May 19, 2022 - MAPLD Sessions
Time (PST) Session Speaker
7:00 AM  
Registration in Salon A Foyer: 7:00AM - 11:00AM
Breakfast 7:00AM - 9:00AM
8:00 AM
Invited
AMD Xilinx AI/ML Inference Solution

Jim Heaton & Steven Yeung, AMD/Xilinx
9:00 AM
Intro
MAPLD Technical Program Introduction

Chair:Matthew Cannon, Sandia National Laboratories
9:05 AM
Session I
Introduction to Session I: MAPLD

Chair:Gary Burch, Moog
9:10 AM
 
Tensil - Open Source ML Accelerators

Thomas Alcorn and Peter Hizalev, Tensil
9:30 AM
 
Large Capacity RC64-based & PolarFire-based Storage for Space Applications

Lisa Kuo, Ramon Space
9:50 AM
 
Mantis: A Strategic Radiation Hardened Field Programmable Gate Array

Trey Peterson, Indiana University
10:10 AM BREAK: 30 Minutes
10:40 AM
 
Low Cost, On-Speed SEE Injection in FPGA Designs

Kamesh Ramani, Siemens Electronic Design Automation
11:00 AM
 
Post-Quantum Stateful Hash-Based Signature Scheme for Improved Bluetooth Security

Mohamed El-Hadedy, California Polytechnic University
11:20 AM
 
High-Performance Embedded Computing SoC for the Earth Surface Mineral Dust Source (EMIT) Instrument

Didier Keymeulen, NASA Jet Propulsion Laboratory
11:40 AM
 
How Early Adoption of RTL Designer-Centric Solutions Improves Schedule Predictability

Rusty Stuber, Siemens Electronic Design Automation
12:00 PM End of Thursday Technical Sessions
End of 2022 SEE/MAPLD Workshop

Details about 2022 SEE/MAPLD Invited Speakers and/or Tutorial Sessions coming soon

2022 Exhibitor Registration is Open

NEW: 2022 SEE/MAPLD Official Exhibitor Floor Plan Assignments

Please contact Teresa Farris if you have any questions.

Teresa Farris
Archon, LLC
Teresa.Farris@archon-llc.com

2022 Workshop Exhibitors
Infineon Technologies Logo

Infineon Technologies Space and Satellite
phone: 866-951-9519
web: www.infineon.com
CAES Logo

CAES
phone: 703-414-5300
web: www.caes.com
Radiation Test Solutions Logo

Radiation Test Solutions, Inc.
phone: 719-531-0800
web: www.radiationtestsolutions.com

Integra Logo
Integra Technologies
phone: 316-630-6801
web: www.integra-tech.com

Topline Logo
Topline
phone: 800-776-9888
web: topline.tv
Microchip Technology Inc. Logo
Microchip Technology Inc.
phone: 480-792-7200
web: www.microchip.com
3D Plus Logo

3D Plus
phone: 510-824-5591
web: www.3d-plus.com

Renesas Electronics America Logo
Renesas
phone: 321-724-7247
web: www.renesas.com
Flex Logix Logo
Flex Logix
phone: 925-785-3016
web: www.flex-logix.com
Apogee Semiconductor Logo
Apogee Semiconductor
phone: 972-559-4660
web: www.apogeesemi.com
Robust Chip Logo
Robust Chip, Inc.
phone: 925-425-0820
web: www.robustchip.com

QuickLogic Logo

QuickLogic
phone: 408-990-4000
web: www.QuickLogic.com
Northwestern Medicine Proton Center Logo
Northwestern Medicine Proton Center
phone: 877-887-5807
web: protoncenter.nm.org
Milanowski and Associates Logo
Milanowski & Associates
phone: 619-865-2174
web: radhard.com
Sage Analytical Lab, LLC Logo
Sage Analytical Lab
phone: 858-255-8587
web: www.sagefalab.com
Data Device Corporation Logo
Data Device Corporation
phone: 800-332-5757
web: ddc-web.com
NASA Electronic Parts and Packaging Program
NASA Electronic Parts & Packaging Program
phone: 301-286-8890
web: nepp.nasa.gov
EMPC Logo
Experimental & Mathematical Physics Consultants
phone: 301-869-2317
web: empc.com
SIEMENS EDA
Siemens Electronic Design Automation
phone: 800-547-3000
web: eda.sw.siemens.com
Avalanche Technology Logo
Avalanche Technology
phone: 510-897-3300
web: www.avalanche-technology.com

UC Davis Crocker Nuclear Laboratory

UC Davis Crocker Nuclear Laboratory
phone: 530-752-1460
web: cyclotron.crocker.ucdavis.edu
Tensil.ai Logo
Tensil.ai
phone: 323-825-2676
web: www.tensil.ai
Texas Instruments / SPACE Logo
Texas Instruments Space IC Solutions
phone: 855-226-3113
web: ti.com/space
 

2022 SEE/MAPLD Workshop - Registration Information
Jump to Exhibitor Registration

Ground Rules For All Attendees

Attendees MUST wear their name badges for admittance to the technical sessions, exhibits, and other functions

Registration and badges may not be shared

Badges are ONLY to be used by the person named on the badge

Registration for Attendees / Guests

SEE/MAPLD Technical Registration includes 3 1/2 days of Technical Sessions, Tutorials and Invited Speakers

Breakfast, lunch, and breaks are provided May 16-18, 2022
Breakfast and morning break are provided May 19, 2022

Sunday, May 15th: Registration Reception
Tuesday, May 17th: Exhibitor Reception
Wednesday, May 18th: Poster Reception

Registration Option Early Late (after Friday, April 15)
Technical Attendee $800 $850
Student Attendee $375 $425

Registered Technical Attendees have a choice of guest badges

  • The Reception Guest Badge provides access to the Registration Reception, Exhibitor Reception and Poster Reception
  • The Conference Guest Badge provides access to all Breaks, Lunchs, Registration Reception, Exhibitor Reception and Poster Reception

NOTE: Guests do not have access to the Technical Sessions!

Guest Registration Options Fee
Reception Guest Badge $125
Conference Guest Badge $275

Registration for Technical Attendees, Students, and Guests, is handled exclusively online
We cannot accept checks as a payment option

https://see-mapld.regfox.com/seemapld-2022-attendee-registration

For questions, reservation assistance, or to make changes, contact:

Teresa Farris
Teresa.farris@archon-llc.com
719-964-3617

All meals and evening functions are included in the Attendee registration fee

Exhibitor-Specific Registration Details

The 2022 SEE/MAPLD Exhibits are now open!  The exhibit cost is $2300 which includes One (1) Complimentary Technical Registration and Two (2) Exhibitor Only badges.  Additional Exhibitor Only badges are available for $275.00 and are limited to Three (3) per exhibit

The six-foot exhibit space includes a six-foot skirted table and two chairs. NOTE: this is a table top only exhibit! There is not room for a 10-foot exhibit booth!

All SEE/MAPLD exhibitors will receive free WiFi in the exhibit area!

Tentative set-up, exhibit hours and tear down are:
Set-up:     Tuesday, May 17, 7:15 am– 9:15 am

Hours:      Tuesday, May 17, 9:30 am – 8:00 pm with morning and afternoon
                breaks, a buffet lunch, and an evening reception around the
                exhibit tables

               Wednesday, May 18, 9:30 am – 2:00 pm with a morning break and
               buffet, with exhibitor raffles, around the exhibit tables

Tear down: Wednesday, May 18 after 2:00 pm

https://see-mapld.regfox.com/seemapld-2022-exhibitor-registration

https://see-mapld.regfox.com/seemapld-2022-booth-staff

Registration Options Fee
Exhibitor Booth $2300
Additional Exhibitor-Only Badges $275

Hotel Reservation


Please refer to our Hotel Information page to reserve your room for the SEE/MAPLD Workshop

The Workshop Block of Hotel Reservations for the
2022 SEE/MAPLD Workshop at the La Jolla, CA Marriott is closed.


Please contact Teresa.farris@archon-llc.com for assistance


Local visitor information for La Jolla, CA and the San Diego area

Marriott LaJolla local Arrangement and Transportation Information

All Things La Jolla at LaJolla.com

Discover La Jolla at SanDiego.org




How to get to the San Diego Marriott La Jolla via Metropolitan Transit System





There are two easy ways to get to between the airport and MTS services. First, there's the Route 992 bus which stops right outside of baggage claim at both terminals. It only takes 15 minutes to get to/from Santa Fe Depot in Downtown San Diego, which connects with all major transit options, including three Trolley lines, three Rapid bus lines, the COASTER, and Amtrak. To get to the airport, there's a convenient stop at Kettner Blvd. and W. Broadway (in front of Starbucks), which is across the street from Santa Fe Depot and all connecting transit services. Service on the 992 is every 15 minutes for most of the day, 7 days a week. One-way fares are just $2.50 ($1.25 for Seniors, Disabled, Medicare Recipients and Youth). There are also Ticket Machines at the Airport near Information Centers and at the Santa Fe Depot and America Plaza Trolley stations where you can buy a PRONTO card and add value to take trips all during your stay in San Diego. You can also download the PRONTO mobile app in advance and load money to your account to use for your whole trip!


Airport Shuttle
There's also a free airport shuttle from the Old Town Transit Center. It's call the San Diego Flyer and it picks up and drops off passengers on Pacific Highway at the west side of the Transit Center. It operates approximately every 20-30 minutes, seven days a week. Pick up and drop-offs are timed to meet the first and last Trolley, Coasters, Amtrack trains, and MTS busses with the first pick up at 4:45 a.m. and the last pick up/drop off at 12:30 a.m. This is a service for transit riders only. There is NO OVERNIGHT PARKING at the Old Town Transit Center. For more information on this service, please visit the san.org website and its public transportation page.


2. Blue Line Trolley System

Take the Blue Line Trolley from either the Santa Fe Depot or Old Town Transit Center towards UCSD. Get off at the Executive Rd exit that's 1 block from the hotel. The Blue Line Trolley schedule may be found here.


The trolley also provides an excellent way of exploring San Diego.





Previous SEE Symposium and SEE/MAPLD Home Pages: 2011, 2012, 2013, 2014, 2015, 2016, 2017, 2018, 2019, 2020, 2021

SEE Symposium and SEE/MAPLD Presentation Materials 2006-2019

Contact Us

General Chair(s): SEE: Co-Chairs Rebekah Austin, NASA Goddard Space Flight Center and Steve Lalumondiere, The Aerospace Corporation / MAPLD: Tyler Lovelly, Air Force Research Laboratory
Technical Program Chair(s): SEE: Daniel Loveless, University of Tennessee at Chattanooga / MAPLD: Matthew Cannon, Sandia National Laboratories
Poster Session Chairwoman: Martha O'Bryan, SSAI / NASA Goddard Space Flight Center
Exhibits Chair: Teresa Farris, Archon, LLC
Meeting Planner: Archon, LLC
Website Curator: Carl Szabo, SSAI / NASA Goddard Space Flight Center

SEE/MAPLD Code of Conduct